Hyperbolic Functional Differential Inequalities and Applications formatIsbn:Hardcover 9780792357919 Analog Signal Generation for Built In Self Test 70174 Stuttgart Analog Signal Generation for Built In Self Test (BIST) of Mixed Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique This book is intended to be a reference for a rapidly growing GaAs community of researchers and graduate students The theory of difference and differential difference equations ge nerated by original problems is discussed and its applications to the constructions of numerical methods for functional differential problems are presented criteria of uniqueness and estimates of the error of approximate solutions